Driving Innovation in Image Sensors and High Speed Analog/Mixed-Signal Design

Aldec Product Manager, Dmitry Melnik, recently shared a blog update on Verilog-AMS & Multi-Level Simulation. Within the many inquiries he mentions, we noted a consistent theme related to design challenges in mixed-signal designs in the application areas of Image Sensors and High Speed Data Acquisition and Analysis. To help answer some of these questions, Tanner EDA is hosting an upcoming event featuring industry experts where these challenges will be discussed and insights shared:

Tanner EDA Lunch and Learn Event

Driving Innovation in Image Sensors and High Speed Analog/Mixed-Signal Design

Techmart, Network Meeting Center, Santa Clara, CA 

Thursday, October 24^th

Dan Nenni, SemiWiki founder, will moderate the event where Eric Kurth, Design Manager from FLIR Systems and Dr. Lanny Lewyn, Principal, Lewyn Consulting will discuss how they have solved some of today’s toughest challenges in thermal imaging and high speed A/MS design.  We’ll also have Tanner EDA technical staff at the event providing hands-on demos of HiPer Simulation A/MS and the rest of our IC and MEMS design tools. 

Seating is limited.  Visit the Tanner EDA website to learn more and register for this special event.

About the Mixed-Signal Design Flow

Tanner EDA offers a highly-productive mixed-signal design flow, HiPer Simulation A/MS.  The package is available with Aldec Riviera-PRO™ TE (Tanner Edition), and provides accurate, high-performance co-simulation that allows mixed-signal circuit designers to verify their most complex designs efficiently and effectively.  www.tannereda.com/ams